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5082-2811
Low 1/f noise general purpose Schottky diode
Description
Features
Documents
Data Sheets & Technical Specifications
Application Notes
- Application Note - AN 1088: Designing the Virtual Battery(97 KB,PDF)
- Application Note - AN 1156: Diode Detector Simulation EEs ADS Softward(162 KB,PDF)
- Application Note - AN 923: Schottky Barrier Video Detectors(190 KB,PDF)
- Application Note - AN 9441: Microwave Transistor Bias Considerations(113 KB,PDF)
- Application Note - AN 9561: The Criterion for the Tangential Sensitivity Measurement(132 KB,PDF)
- Application Note - AN 9563 Flicker Noise Schottky Diodes(145 KB,PDF)
- Application Note - AN 956-3 Flicker Noise Schottky Diodes(145 KB,PDF)
- Application Note - AN 956-4; Schottky Diode Voltage Doubler(83 KB,PDF)
- Application Note - AN 956-5: Dynamic Range Extension Schottky Detectors(51 KB,PDF)
- Application Note - AN 956-6: Temperature Dependence Schottky Detector Voltage Sensitivity (41 KB,PDF)
- Application Note - AN 963: Matching Techniques for Mixers Detectors(250 KB,PDF)
- Application Note - AN 987: Is Bias Current Necessary(66 KB,PDF)
- Application Note - AN 988: All Schottky Diodes are Zero Bias Detectors(73 KB,PDF)
- Application Note - AN A004R: Electrostatic Discharge mage Control(148 KB,PDF)
- Application Note - AN A006: Mounting Considerations for Microwave Semiconductors(87 KB,PDF)
Obsolescence Notices
Product Change Notices
- Product Changes Notice (PCN) - CCN:9907a - 5082 and 1N marking change(28 KB,PDF)
- Product Changes Notice (PCN) - CCN:Glassdiode - Improvement in Manufacturing Cycle Time.(18 KB,PDF)
- Product Changes Notice (PCN) - CCN021402AT1 - Transfer of semiconductor wafer fabrication(17 KB,PDF)
- Product Changes Notice (PCN) - CCN082401TC1 - Si wafer epitaxy transferred from Newark to San Jose, CA fab(24 KB,PDF)
- Product Changes Notice (PCN) - PCN: A04-012-480035-0A, Dec. 2004(16 KB,PDF)
- Product Changes Notice (PCN) - RF/mW Schottky and PIN Diodes in Glass Package Outline 15.(18 KB,PDF)
Quality & Reliability
